The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Sep. 27, 2013
National University Corporation Hokkaido University, Sapporo-shi, Hokkaido, JP;
NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY, Sapporo-Shi, Hokkaido, JP;
Abstract
The present invention relates to an optical phase measuring method and an optical phase measuring device which can measure phase information contained in an object beam with high accuracy. Intensity distributions of a test object beam, a first reference beam and a first hologram made from the object beam and the first reference beam are detected by the first light intensity detection section. Intensity distributions of the test object beam, a second reference beam and a second hologram made from the object beam and the second reference beam are detected in the second light intensity detection section. Phase information contained in the object beam is computed on the basis of the intensity distributions detected in the first light intensity detection section and the intensity distributions detected in the second light intensity detection section.