The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Feb. 28, 2013
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Hisato Fukuda, Muko, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamberand an interference optical system are mounted, where an accessorycan be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading meansfor reading accessory information provided to the accessorywhen the accessoryis mounted in the sample chamber; and setting condition changing means (controller) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means, the setting condition varying depending on, e.g., a difference in weight between respective accessories