The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Jul. 05, 2012
Giampiero Guasco, Rivalta di Torino, IT;
Giampiero Guasco, Rivalta di Torino, IT;
HEXAGON METROLOGY S.P.A., Moncalieri, IT;
Abstract
A method of calibration of a mathematical model for the compensation of errors due to dynamic deformation of a measuring machine equipped with a mobile unit able to move a stylus probe in un measuring volume, wherein the model provides, in response to at least one input quantity correlated with a control signal of said drive means, a plurality of output quantities comprising at least one component of the measurement error introduced by the deformation and at least one quantity detected by a laser sensor and correlated with the deformation. In the calibration step, the mobile unit is subjected to a movement cycle constituted by small-amplitude oscillations of variable frequency, following the law of sinusoidal motion, keeping the tip of the probe blocked; during the movement cycle, the input and output quantities are sampled and supplied to an algorithm for model identification.