The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Nov. 15, 2013
Applicant:
Emhart Glass S.a., Cham, CH;
Inventor:
Jonathan S. Simon, Pleasant Valley, CT (US);
Assignee:
Emhart Glass S.A., Cham, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); C03B 9/41 (2006.01); G01N 33/38 (2006.01); G01J 5/00 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
C03B 9/41 (2013.01); G01N 21/90 (2013.01); G01N 33/386 (2013.01); G01J 2005/0048 (2013.01); G01J 2005/0077 (2013.01); G01N 2021/9063 (2013.01); G05B 2219/2635 (2013.01); Y02P 40/57 (2015.11);
Abstract
A closed loop temperature and wall thickness-based control system for improving process yield and quality while reducing dependence on operator skill utilizes intensity information from a hot end container imaging system and wall thickness information from a hot glass container wall thickness measurement system. By utilizing both the container intensity information and the measured wall thickness information it is possible to provide separate feedback signals responsive to temperature variations and thickness variations. These signals are used to implement automatic closed loop control of the I.S. machine.