The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Nov. 15, 2013
Emhart Glass S.a., Cham, CH;
Jonathan S. Simon, Pleasant Valley, CT (US);
Emhart Glass S.A., Cham, CH;
Abstract
A closed loop temperature and wall thickness-based control system for improving process yield and quality while reducing dependence on operator skill utilizes intensity information from a hot end container imaging system and wall thickness information from a hot glass container wall thickness measurement system. By utilizing both the container intensity information and the measured wall thickness information it is possible to provide separate feedback signals responsive to temperature variations and thickness variations. These signals are used to implement automatic closed loop control of the I.S. machine.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile