The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Mar. 12, 2014
Applicant:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Inventors:

Daniel Bublitz, Rausdorf, DE;

Matthew J. Everett, Livermore, CA (US);

Csaba Farkas, Pleasanton, CA (US);

Michael Kempe, Jena, DE;

Yue Qiu, Pleasanton, CA (US);

Tobias Schmitt-Manderbach, Jena, DE;

Assignees:

CARL ZEISS MEDITEC, INC., Dublin, CA (US);

CARL ZEISS MEDITEC AG, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/14 (2006.01); A61B 3/10 (2006.01); G02B 21/00 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/1025 (2013.01); A61B 3/12 (2013.01); G02B 21/0028 (2013.01); G02B 21/0032 (2013.01);
Abstract

Systems and methods for Broad Line Fundus Imaging (BLFI), an imaging approach that is a hybrid between confocal and widefield imaging systems, are presented. These systems and methods are focused on improving the quality and signal of broad line fundus images or imaging methods to create high contrast and high resolution fundus images. Embodiments related to improved pupil splitting, artifact removal, reflex minimization, adaptable field of view, instrument alignment and illumination details are considered.


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