The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Oct. 08, 2015
Dual Aperture International Co. Ltd., Seongnam-si, KR;
Andrew Augustine Wajs, Haarlem, NL;
David D. Lee, Palo Alto, CA (US);
Seungoh Ryu, Newton, MA (US);
Taekun Woo, Yorba Linda, CA (US);
DUAL APERTURE INTERNATIONAL CO. LTD., Seongnam-Si, KR;
Abstract
An application programming interface (API) provides access to a multi-aperture imaging system. By using the API, higher level applications can access and/or specify the image capture by the multi-aperture imaging device. For example, the API can support the specification of various image capture parameters: resolution, frame rate, exposure, flash, filtering, and additional processing to be applied. These could be specified for all frames and all channels (Red, Green, Blue and Infrared), or could be specified for specific subframes within a frame and/or for specific channels. The API can also specify output data from the multi-aperture imaging device. This can include raw pixel data, image data (color and Infrared), depth maps, and other processed image data. It can also include metadata and data about the status of the multi-aperture imaging device.