The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Jan. 21, 2015
Applicant:
Anritsu Company, Morgan Hill, CA (US);
Inventors:
Derek Truesdale, San Jose, CA (US);
Wesley Whiteley, Hollister, CA (US);
Assignee:
ANRITSU COMPANY, Morgan Hill, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/10 (2015.01); G01R 25/04 (2006.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
H04B 17/104 (2015.01); G01R 25/04 (2013.01); H04B 17/11 (2015.01);
Abstract
In an embodiment, a method for calculating PIM associated with a DUT comprises obtaining a first measurement of PIM with the DUT connected to the measuring instrument, introducing a shift in a phase offset of PIM produced at the DUT in response to test signals generated by the measuring instrument, obtaining, upon introducing the shift, a second measurement of PIM with the DUT connected to the measuring instrument and calculating the PIM associated with the DUT based on the first measurement and the second measurement.