The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Dec. 02, 2015
Applicant:
Freescale Semiconductor, Inc., Austin, TX (US);
Inventors:
Assignee:
FREESCALE SEMICONDUCTOR, INC., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
H01L 23/573 (2013.01); H01L 23/585 (2013.01);
Abstract
A system for generating a tamper detection signal indicating tampering with one or more circuits of an integrated circuit (IC) includes both a static wire mesh and an active wire mesh. The wire meshes can be formed in the same layer over the circuits to be protected or in different layers. The wire meshes also may cover the entire chip area or only predetermined areas, such as over secure memory and register areas. The wire meshes are connected to a tamper detection module, which monitors the meshes and any signals transmitted via the meshes to detect attempts to access the protected circuits via micro-probing.