The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Mar. 30, 2015
Applicant:

Hgst Netherlands B.v., Amsterdam, NL;

Inventor:

Ryoji Fukuhisa, Tokyo, JP;

Assignee:

HGST Netherlands B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 20/12 (2006.01); G06F 12/10 (2016.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1217 (2013.01); G06F 3/0608 (2013.01); G06F 3/0644 (2013.01); G06F 3/0676 (2013.01); G06F 12/10 (2013.01); G06F 2212/1041 (2013.01); G06F 2212/152 (2013.01); G06F 2212/21 (2013.01); G06F 2212/253 (2013.01); G06F 2212/70 (2013.01); G11B 2020/1238 (2013.01);
Abstract

A system and method is described that allows random write operations regions utilizing shingled magnetic recording. The method includes receiving a request to re-write a logical block address (LBA) with new data, wherein the LBA is mapped to a physical block address (PBA) on a storage medium. The method further includes determining whether the data is eligible for a write-in place update wherein the data is written to an area of the I-region that has previously been written with shingled data tracks, wherein the eligibility determination is based on a mapping list of LBAs to PBAs. The method also includes writing the new data to the area of the I-region determined to be eligible for a write-in place update, wherein writing the new data further includes writing management information to the I-region that identifies a starting LBA of the write-in place update, and a length of the write-in place update.


Find Patent Forward Citations

Loading…