The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
May. 23, 2015
Hgst Netherlands B.v., Amsterdam, NL;
David Ernest Call, Folsom, CA (US);
Takayuki Fukumoto, Fujisawa, JP;
Norman Macy Tecson Libunao, Laguna, PH;
HGST NETHERLANDS B.V., Amsterdam, NL;
Abstract
Structures and methods are disclosed for parallel biasing and testing, at dc and high frequency, of two or more read heads within a two dimensional magnetic recording (TDMR) slider. Testing of heads comprises both conventional tests of the individual heads within the slider, as well as tests for interactions between the heads which are very closely spaced within the slider and thus may exhibit various magnetic, capacitive, ohmic, and stress-related interactions not seen in non-TDMR heads having only a single read head. Overall testing times are nearly the same as for single head testing.