The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9454821 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 27, 2016

Filed:

Jan. 07, 2015
Applicants:

Chenyang GE, Xi'an, Shaanxi, CN;

Yanhui Zhou, Xi'an, Shaanxi, CN;

Inventors:

Chenyang Ge, Shaanxi, CN;

Huimin Yao, Shaanxi, CN;

Yanhui Zhou, Shaanxi, CN;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 7/20 (2006.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0065 (2013.01); G06K 9/2036 (2013.01); G06T 7/0057 (2013.01); G06T 7/202 (2013.01); G06T 2207/10048 (2013.01);
Abstract

A method of depth perception based on binary laser speckle images comprises: read in binary input and reference speckle images (pattern fixed, distance known) to generate input and reference speckle windows, extract an image block of a certain size in the input speckle window, search for the matching block in the matching search window of the reference speckle window, use a method for block-based XOR (exclusive or) similarity calculation to compare and output a minimum similarity value or use a block-based IAD (inclusive and) method to compare and output a maximum similarity value to get the optimal matching block and the optimal offset, and then work out the depth information of the central point of the optimal matching block via a formula for depth calculation. The method not only can be easily implemented in hardware and greatly simplify depth calculation, but can also generate high-resolution and high-precision depth information in a fast and accurate manner.


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