The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Feb. 25, 2013
Applicant:
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Inventors:
Gabriel Popescu, Champaign, IL (US);
Taewoo Kim, Urbana, IL (US);
Assignee:
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/007 (2013.01); G02B 21/36 (2013.01); G02B 21/361 (2013.01);
Abstract
Methods and a module for use with a microscope for enhancing image contrast in an image of a phase object. A transmission image of a specimen is formed in an image plane, of which a Fourier transform is generated in a Fourier plane. An amplitude filter is applied to the Fourier transform field, which is then transformed back to an image at a focal plane of a detector array. An image signal from the detector array is processed to generate a contrast-enhanced image of the specimen.