The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Mar. 15, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Caleb Welton, Foster City, CA (US);
Hitoshi Harada, Foster City, CA (US);
Jeffrey Cohen, Sunnyvale, CA (US);
Lei Chang, Beijing, CN;
Radhika Reddy, Cupertino, CA (US);
Tao Ma, Beining, CN;
Zhanwei Wang, Beijing, CN;
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30463 (2013.01);
Abstract
A method and system for executing database queries in parallel using a shared metadata store. The metadata store may reside on a master node, and the master node may distribute this metadata with query plans to worker nodes. The worker nodes may request additional metadata from the master node when necessary.