The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Jan. 19, 2012
Applicants:

David Collingwood, Stroud, GB;

Robert John Bragg, Stroud, GB;

Inventors:

David Collingwood, Stroud, GB;

Robert John Bragg, Stroud, GB;

Assignee:

RENISHAW PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01); G01B 7/012 (2006.01); G05B 19/18 (2006.01); G01B 7/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/182 (2013.01); G01B 5/012 (2013.01); G01B 7/00 (2013.01); G01B 7/012 (2013.01);
Abstract

An analogue probe for a machine tool apparatus, which includes a probe body, a stylus member movably secured to the probe body and a sensor that measures the extent of displacement of the stylus member relative to the probe body, in which the sensor is contained within a chamber in the probe body. The analogue probe further includes a vent between the chamber and the outside of the probe body, configured such that, when the vent is open, the pressure within the chamber can equalize with the analogue probe's operating environment's pressure, and is further configured such that the vent's opening to the outside of the probe body can be closed so as to seal the chamber and the sensor from external contaminants during operation of the analogue probe.


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