The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Mar. 28, 2013
Applicants:

Nitto Denko Corporation, Ibaraki-shi, JP;

Mitsubishi Chemical Corporation, Chiyoda-ku, JP;

Inventors:

Takashi Shimizu, Osaka, JP;

Kazuki Uwada, Osaka, JP;

Tadashi Kojima, Osaka, JP;

Nao Murakami, Osaka, JP;

Tomohiko Tanaka, Fukuoka, JP;

Shingo Namiki, Fukuoka, JP;

Assignees:

NITTO DENKO CORPORATION, Ibaraki-shi, JP;

MITSUBISHI CHEMICAL CORPORATION, Chiyoda-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); C08G 64/16 (2006.01); H01L 51/52 (2006.01); G02B 1/08 (2006.01);
U.S. Cl.
CPC ...
G02B 5/305 (2013.01); C08G 64/1608 (2013.01); G02B 1/08 (2013.01); G02B 5/3033 (2013.01); G02B 5/3083 (2013.01); H01L 51/5281 (2013.01); Y10T 156/10 (2015.01);
Abstract

The present invention provides a retardation film web having sufficient reversed wavelength dispersion characteristics and favorable for film lamination according to a roll-to-roll system. A retardation film web of the present invention includes a polycarbonate resin or a polyester carbonate resin, an orientation angle θ which is an angle between a slow axis and a width direction satisfies the following formula (I), and a ratio of an in-plane retardation R450 measured at a wavelength of 450 nm to an in-plane retardation R550 measured at a wavelength of 550 nm satisfies the following formula (II):38°≦θ≦52°  (I)R450/R550<1  (II).


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