The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Aug. 18, 2011
Applicants:

Shouichi Miyawaki, Tokyo, JP;

Hiroyuki Takeuchi, Tokyo, JP;

Inventors:

Shouichi Miyawaki, Tokyo, JP;

Hiroyuki Takeuchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/58 (2006.01); G01R 33/389 (2006.01); G01R 33/565 (2006.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
G01R 33/58 (2013.01); A61B 5/055 (2013.01); G01R 33/56509 (2013.01); G01R 33/56518 (2013.01);
Abstract

Regardless of the measurement conditions, the degradation of the image quality due to a vibrational error magnetic field, which is generated by the vibration of the mechanical structure of an MRI apparatus, is reduced. In order to do so, error magnetic field image data indicating an error magnetic field distribution is acquired on the basis of an echo signal measured using a pulse sequence having a test gradient magnetic field, a parameter value of a damped vibration function showing a vibrational error magnetic field is calculated using the error magnetic field image data, and a correction magnetic field is calculated on the basis of the calculated parameter value of the damped vibration function showing the vibrational error magnetic field.


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