The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9453868 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 27, 2016

Filed:

Mar. 23, 2012
Applicants:

Hiroyuki Kimata, Tokyo, JP;

Satoru Ishizaka, Tokyo, JP;

Inventors:

Hiroyuki Kimata, Tokyo, JP;

Satoru Ishizaka, Tokyo, JP;

Assignee:

MITSUBISHI ELECTRIC CORPORATION, Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/002 (2013.01); G01R 31/2817 (2013.01);
Abstract

When static electrical charge by electromagnetic waves is applied to a test-target board or test noises are applied to the ground of the test-target board, a test device tests as to whether or not noises are conducted through a path from an OUT terminal of an amplifier circuit to the ground of the test-target board, and a test device tests as to whether or not noises are conducted through a path from an OUT terminal of an amplifier circuit to the ground of the test-target board together with the number of conductions.


Find Patent Forward Citations

Kimata, Hiroyuki. (2016). Test device, test method, and program (U.S. Patent No. 9453868). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9453868

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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