The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Nov. 16, 2012
International Business Machines Corporation, Armonk, NY (US);
Gerald K. Bartley, Rochester, MN (US);
Matthew S. Doyle, Rochester, MN (US);
Richard B. Ericson, Rochester, MN (US);
Wesley D. Martin, Rochester, MN (US);
George R. Zettles, IV, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and computer program product are provided for implementing frequency spectrum analysis of noise in a device under test using causality (Hilbert Transform) results of Vector Network Analyzer (VNA) VNA-generated S-parameter model Information. A plurality of S-parameter samples are collected from the VNA generated S-parameter model Information. A Hilbert Transform of the collected plurality of S-parameter samples is used for error magnitude per frequency point analysis. An average error magnitude of predefined collected error magnitude samples is calculated to identify environmental noise in the device under test and used to identify acceptable environmental effects on the device under test.