The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Jan. 23, 2014
Applicant:

Washington University, St. Louis, MO (US);

Inventors:

Stuart A. Solin, St. Louis, MO (US);

Kirk D. Wallace, St. Louis, MO (US);

Samuel A. Wickline, St. Louis, MO (US);

Michael S. Hughes, Wildwood, MO (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/04 (2006.01); G01N 15/10 (2006.01); G01R 33/09 (2006.01); G01R 33/12 (2006.01); G11C 11/18 (2006.01); G01R 27/02 (2006.01); G11C 11/16 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/04 (2013.01); G01N 15/1031 (2013.01); G01R 27/02 (2013.01); G01R 33/09 (2013.01); G01R 33/095 (2013.01); G01R 33/1269 (2013.01); G11C 11/161 (2013.01); G11C 11/18 (2013.01); G01N 2015/0038 (2013.01);
Abstract

Disclosed herein is an apparatus comprising a metal shunt and a semiconductor material in electrical contact with the metal shunt, thereby defining a semiconductor/metal interface for passing a flow of current between the semiconductor material and the metal shunt in response to an application of an electrical bias to the apparatus, wherein the semiconductor material and the metal shunt lie in different planes that are substantially parallel planes, the semiconductor/metal interface thereby being parallel to planes in which the semiconductor material and the metal shunt lie, and wherein, when under the electrical bias, the semiconductor/metal interface is configured to exhibit a change in resistance thereof in response to a perturbation. Such an apparatus can be used as a sensor and deployed as an array of sensors.


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