The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Jul. 21, 2015
Applicant:

H2optx Inc., San Jose, CA (US);

Inventors:

Rudolf J. Hofmeister, San Jose, CA (US);

Donald A. Ice, Milpitas, CA (US);

Scott W. Tandy, Los Altos Hills, CA (US);

Assignee:

H2Optx Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/42 (2006.01); G01J 3/44 (2006.01); G01J 3/06 (2006.01); G01J 3/10 (2006.01); B01D 46/00 (2006.01); B01D 46/42 (2006.01); G01N 1/06 (2006.01); G01N 33/15 (2006.01); G01N 21/01 (2006.01); G01N 23/00 (2006.01); G01N 35/10 (2006.01); G01N 21/3504 (2014.01); G01J 3/00 (2006.01); G01N 21/33 (2006.01); G01N 21/3577 (2014.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); B01D 46/0002 (2013.01); B01D 46/42 (2013.01); G01J 3/00 (2013.01); G01J 3/06 (2013.01); G01J 3/10 (2013.01); G01J 3/44 (2013.01); G01N 1/06 (2013.01); G01N 21/01 (2013.01); G01N 21/25 (2013.01); G01N 21/253 (2013.01); G01N 21/33 (2013.01); G01N 21/3504 (2013.01); G01N 21/3577 (2013.01); G01N 21/65 (2013.01); G01N 23/00 (2013.01); G01N 33/15 (2013.01); G01N 35/10 (2013.01); G01N 2021/0106 (2013.01);
Abstract

The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.


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