The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Jan. 10, 2012
Christian Schorr, St. Gallen, CH;
Frank Schroeder, St. Gallen, CH;
Romy Koch, Widnau, CH;
Kurt Giger, Rüthi, CH;
Christian Schorr, St. Gallen, CH;
Frank Schroeder, St. Gallen, CH;
Romy Koch, Widnau, CH;
Kurt Giger, Rüthi, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A measuring appliance in which inputted or measured spatial points and a horizontal projection representation or spatial representation of at least some spatial points from the quantity of spatial points can be displayed, said points being at least partially connected by lines. The measuring appliance has a representation-changing functionality in the framework of which, according to a line selected on the user side from the lines displayed in a horizontal projection representation or a spatial representation, in an automatically controlled manner by means of the evaluation and control unit: a virtual surface is defined by the selected line and a direction provided as the vertical; a subset of spatial points is selected from the quantity of spatial points, lying inside a buffer zone surrounding the virtual surface in a defined manner; and a vertical projection representation of exclusively such spatial points pertaining to the subset is displayed on the display.