The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Jun. 24, 2013
Applicants:

Pola Pharma Inc., Tokyo, JP;

Nihon Nohyaku Co., Ltd., Tokyo, JP;

Inventors:

Takaaki Masuda, Kanagawa, JP;

Yoshiyuki Miyata, Tokyo, JP;

Hideo Kaneda, Tokyo, JP;

Assignees:

POLA PHARMA INC., Tokyo, JP;

NIHON NOHYAKU CO., LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07D 409/06 (2006.01);
U.S. Cl.
CPC ...
C07D 409/06 (2013.01);
Abstract

Means for improving the solubility of luliconazole is provided. A crystal of luliconazole represented by the following formula is provided, wherein the crystal has such a crystal habit that (011) plane is a specific crystal growth plane. The crystal is characterized in that Iwith respect to a sum total of I, I, I, I, I, I, I, I, I, I, I, I, I, I, and Iis not less than 25%, provided that integrated intensities of diffraction peaks, which correspond to the (001), (100), (10-1), (011), (110), (11-1), (10-2), (11-2), (020), (021), (20-2), (121), (013), (11-3), and (221) planes, are designated as I, I, I, I, I, I, I, I, I, I, I, I, I, I, and Irespectively in relation to the diffraction peaks detected in a range of 2θ=5 to 35° in a powder X-ray diffractometry using CuKα radiation.


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