The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Jan. 15, 2014
Applicant:

Ngk Insulators, Ltd., Nagoya, JP;

Inventors:

Yoshio Kikuchi, Nagoya, JP;

Haruo Otsuka, Ichinomiya, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B 39/04 (2006.01); B01D 71/02 (2006.01); B01J 29/06 (2006.01); B01J 35/04 (2006.01); B01D 53/94 (2006.01);
U.S. Cl.
CPC ...
C01B 39/04 (2013.01); B01D 71/028 (2013.01); B01J 29/06 (2013.01); B01J 35/04 (2013.01); B01D 53/9413 (2013.01); B01D 2253/108 (2013.01); B01D 2255/20738 (2013.01); B01D 2255/20761 (2013.01); B01D 2255/50 (2013.01); B01D 2255/502 (2013.01); B01D 2255/912 (2013.01); B01D 2255/92 (2013.01);
Abstract

The zeolite structure is a porous zeolite structure constituted of a formed article obtained by extruding a zeolite raw material containing zeolite particles and an inorganic binding material including at least basic aluminum chloride, a ratio P(P=V/V×100) of a volume Vof the inorganic binding material in the zeolite structure with respect to a volume Vof the zeolite structure is from 10 to 50 vol %, and a relation of equation (1) is satisfied:P2/P1≦1.0  (1),in which Pis the ratio of the volume Vof the inorganic binding material in the zeolite structure with respect to the volume Vof the zeolite structure and P(P=Vb/Va×100) is a ratio of volumes Vb of pores having pore diameters of 0.003 to 0.03 μm with respect to the whole pore volume Va of the zeolite structure.


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