The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2016

Filed:

Oct. 19, 2012
Applicant:

Memc Electronic Materials, Inc., St. Peters, MO (US);

Inventors:

Jia Wei Chew, Pasadena, TX (US);

Satish Bhusarapu, Sugarland, TX (US);

Keith E. Weatherford, Pasadena, TX (US);

Assignee:

SunEdison, Inc., Maryland Heights, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 7/00 (2006.01); B01J 8/18 (2006.01);
U.S. Cl.
CPC ...
B01J 8/1809 (2013.01); B01J 2208/00539 (2013.01);
Abstract

A method and apparatus for determining the fluidization quality of a fluidized bed reactor is disclosed. The method includes measuring pressure within the fluidized bed reactor to obtain a pressure signal. The pressure signal is then transformed using wavelet decomposition into higher-frequency details and lower-frequency approximations. The dominance of the various features is then calculated based on the energy of each feature in relation to the normalized wavelet energies. The fluidization quality of the fluidized bed reactor is then determined from a comparison over time of the calculated energies.


Find Patent Forward Citations

Loading…