The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Jun. 24, 2014
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Ben Allen Campbell, Irving, TX (US);

Sam Eric McMurry, Richardson, TX (US);

Robert James Sparks, Plano, TX (US);

Assignee:

ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 12/801 (2013.01);
U.S. Cl.
CPC ...
H04L 47/10 (2013.01);
Abstract

Methods, systems, and computer readable media for collecting and distributing Diameter overload control information to non-adjacent nodes are disclosed. One system for implementing the subject matter described herein includes a Diameter overload control information broker. The Diameter overload control information broker includes a Diameter overload control information collector for receiving Diameter overload control information from at least one Diameter node separate from the Diameter overload control information broker. The broker includes a memory for storing the overload control information. The broker further includes a Diameter overload control information distributor for distributing the Diameter overload control information to at least one Diameter node that is not adjacent to the at least one Diameter node from which the overload control information was received.


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