The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Dec. 01, 2014
Applicant:

Microsemi Storage Solutions (Us), Inc., Aliso Viejo, CA (US);

Inventors:

Rino Micheloni, Turate, IT;

Alessia Marelli, Dalmine, IT;

Christopher I. W. Norrie, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1125 (2013.01); G06F 11/1048 (2013.01); G06F 11/1072 (2013.01); H03M 13/1108 (2013.01);
Abstract

A nonvolatile memory controller includes memory storage configured to store a two-index look-up table that includes a Log-Likelihood Ratio (LLR), hard-and-soft-decision bits associate with the LLR and a neighboring cell read pattern associated with the LLR. Read circuitry is configured to perform a plurality of reads of a cell of a nonvolatile memory storage module at different read voltage levels to generate target cell hard-and-soft-decision bits and configured to read neighboring cells to generate neighboring cell reads. Neighboring cell processing circuitry combines the neighboring cell reads to generate a neighboring cell read pattern. Look-up circuitry accesses the two-index look-up table using the target cell hard-and-soft-decision bits and the neighboring cell read pattern to identify the corresponding LLR for use in Low-Density Parity Check (LDPC) decoding of a codeword stored in the nonvolatile memory storage module.


Find Patent Forward Citations

Micheloni, Rino. (2016). High quality log likelihood ratios determined using two-index look-up table (U.S. Patent No. 9450610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9450610

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…