The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Dec. 09, 2014
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Kie Bong Ku, Icheon-si, KR;
Byung Kuk Yoon, Icheon-si, KR;
Assignee:
SK hynix Inc., Icheon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01); H03K 21/08 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
H03K 21/08 (2013.01); G01R 31/30 (2013.01); G11C 29/021 (2013.01); G11C 29/12015 (2013.01); G11C 29/50 (2013.01); G11C 29/50012 (2013.01);
Abstract
A test circuit of a semiconductor apparatus may include a period signal counting block configured to count a period signal by a predetermined number of times, and enable an overflow signal. The test circuit of the semiconductor apparatus may include a clock signal counting block configured to count an internal clock signal until the overflow signal is enabled, and may output clock counting codes. The test circuit of the semiconductor apparatus may include an update register configured to receive and store the clock counting codes based on the overflow signal.