The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Jan. 12, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Miao Li, San Diego, CA (US);

Li Sun, San Diego, CA (US);

Zhi Zhu, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03F 3/45 (2006.01); H03F 1/30 (2006.01); H03G 3/30 (2006.01); H03K 19/003 (2006.01); H03K 19/0185 (2006.01);
U.S. Cl.
CPC ...
H03F 1/30 (2013.01); H03F 3/45076 (2013.01); H03F 3/45183 (2013.01); H03G 3/3036 (2013.01); H03K 19/00384 (2013.01); H03K 19/018528 (2013.01); H03F 2200/447 (2013.01); H03F 2203/45116 (2013.01); H03F 2203/45244 (2013.01);
Abstract

An apparatus is provided. The apparatus includes a calibration circuit configured to generate a reference signal and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit may be configured to generate the reference signal independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal may be generated independently of the at least one differential circuit.


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