The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Mar. 03, 2015
Applicants:

Hisanori Aikawa, Seoul, KR;

Masayoshi Iwayama, Seoul, KR;

Akiyuki Murayama, Tokyo, KR;

Inventors:

Hisanori Aikawa, Seoul, KR;

Masayoshi Iwayama, Seoul, KR;

Akiyuki Murayama, Tokyo, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 43/12 (2006.01); H01L 27/22 (2006.01); H01L 29/82 (2006.01); H01L 43/08 (2006.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); H01L 22/14 (2013.01); H01L 43/12 (2013.01); H01L 27/224 (2013.01); H01L 29/82 (2013.01); H01L 43/08 (2013.01);
Abstract

According to one embodiment, a manufacturing method of a magnetic memory device, includes obtaining first and second magnetic fields for each of magnetoresistive effect elements, defining a group of the elements, for the first and second magnetic fields of the elements in the group, a highest first magnetic field being lower than a lowest second magnetic field, and a difference between the highest first magnetic field and the lowest second magnetic field being greater than a predetermined difference, determining a maximum applied magnetic field higher than the highest first magnetic field and lower than the lowest second magnetic field, and obtaining magnetic characteristics for each of the elements in the group by applying a magnetic field decreasing from the maximum applied magnetic field after the magnetic field is increased up to the maximum applied magnetic field.


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