The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Oct. 20, 2015
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Rajan Paudel, Fremont, CA (US);

Jagdish Sabde, Fremont, CA (US);

Sagar Magia, Milpitas, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/14 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/14 (2013.01); G11C 16/0483 (2013.01); G11C 16/3436 (2013.01);
Abstract

Techniques are provided for erasing a memory device. In one aspect, different zones of a block can be separately erased and subject to a verify test. Erase parameters can be optimized for each zone, so that endurance is improved. If one zone is found to be too slow to erase, it can be marked as being bad while other zones remain available for use. In another aspect, the zone-based erase occurs after a block based erased when a criterion is met, such as the block-based erase being too slow or failing to complete within an allowable number of program loops. The zone-based erase can occur after the block-based erase in the same erase operation, or in a subsequent, new erase operation.


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