The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Jan. 08, 2013
Sony Corporation, Tokyo, JP;
Eiichi Tanaka, Chiba, JP;
Masanobu Tamai, Chiba, JP;
Hiroaki Morikawa, Kanagawa, JP;
Hirokazu Tatsuta, Tokyo, JP;
Suguru Dowaki, Kanagawa, JP;
Tomohiro Hayakawa, Saitama, JP;
Eriko Matsui, Tokyo, JP;
Shin Hasegawa, Kanagawa, JP;
Tatsuya Minakawa, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
There is provided a measurement apparatus including an objective lens, a stage, a setting unit, and a controller. The stage is configured to support a sample vessel in which a plurality of wells each containing a sample are arranged and to define relative positions of the sample vessel and the objective lens. The setting unit is configured to determine whether to set each of the plurality of wells to be a measurement target and set the measurement target. The controller is configured to control the stage such that a well determined to be the measurement target by the setting unit and the objective lens face each other.