The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Oct. 01, 2008
Kuansan Wang, Bellevue, WA (US);
Toby H. Walker, Wayne, PA (US);
Zijian Zheng, Shoreline, WA (US);
Frederic H. Behr, Jr., Kirkland, WA (US);
Yu Chen, Redmond, WA (US);
Robert C. Wang, Redmond, WA (US);
Kuansan Wang, Bellevue, WA (US);
Toby H. Walker, Wayne, PA (US);
Zijian Zheng, Shoreline, WA (US);
Frederic H. Behr, Jr., Kirkland, WA (US);
Yu Chen, Redmond, WA (US);
Robert C. Wang, Redmond, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
The ranking quality of a ranked list may be evaluated. In an example embodiment, a method is implemented by a system to access log data, ascertain which entries of a ranked list are skipped, and determine a ranking quality metric from the skipped entries. More specifically, log data that reflects user interactions with a ranked list having multiple entries is accessed. The user interactions include at least indications of which of the multiple entries are selected entries. It is ascertained which entries of the multiple entries of the ranked list are skipped entries based on the selected entries. The ranking quality metric for the ranked list is determined responsive to the skipped entries.