The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Dec. 28, 2012
Applicant:
Emccorporation, Hopkinton, MA (US);
Inventors:
Xiangping Chen, Sherborn, MA (US);
Richard P. Ruef, Santa Cruz, CA (US);
Samuel L. Mullis, Raleigh, NC (US);
Aron A. Suliman, Harvard, MA (US);
Monica Chaudhary, South Grafton, MA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30156 (2013.01);
Abstract
A method is used in managing data deduplication in storage systems. A data deduplication process is performed by applying a deduplicating technique to data of a deduplication domain. The data deduplication process is scheduled based on a priority. Characteristics of data deduplication performed by the data deduplication process are evaluated. Based on the evaluation, execution of the data deduplication process is effected.