The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Sep. 11, 2012
Applicants:

Bart Oostlander, Northville, MI (US);

Bryce Dunn, Royal Oak, MI (US);

Inventors:

Bart Oostlander, Northville, MI (US);

Bryce Dunn, Royal Oak, MI (US);

Assignee:

Dynatrace LLC, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/32 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/328 (2013.01); G06F 11/302 (2013.01); G06F 11/3055 (2013.01); G06F 11/3409 (2013.01); G06F 2201/865 (2013.01);
Abstract

An improved method is provided for evaluating service quality of a software application residing in a computing environment. The method includes: monitoring first and second metrics indicative of performance of the software application; evaluating the first metric in relation to a first evaluation criterion; evaluating the second metric in relation to a second evaluation criterion different than the first evaluation criterion; and determining the state of service for the software application based in part on the evaluation of the second metric. Over time, the second evaluation criterion is adapted based on the outcome of the evaluation of the first metric.


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