The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Sep. 11, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gang Huang, Beijing, CN;

Tan Jiang, Beijing, CN;

Ling Lan, Beijing, CN;

Yong Yao, Beijing, CN;

Li Yi, Beijing, CN;

Liang Wang, Beijing, CN;

Yu Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 9/50 (2006.01); H04L 29/08 (2006.01); H04W 4/00 (2009.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 9/5072 (2013.01); G06F 11/0709 (2013.01); H04L 67/10 (2013.01); H04W 4/003 (2013.01);
Abstract

A method, apparatus, and/or computer program product analyzes data processing. Dependency metadata, which is used for representing dependency on data among at least two components of an application, is acquired. Error information, which is used for describing errors that occurred while running the application, and data output, which includes data output by components used to run the application, are acquired. Based on the error information, dependency metadata and data output relevant to the error information are analyzed to provide an analysis result. The analysis result includes at least one of: a reason why an error occurs, a prompt for an error correction method, a relevant dependency metadata leading to an occurrence of an error, and relevant data output leading to an occurrence of an error.


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