The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Feb. 24, 2015
Nuomedis Ag, Liestal, CH;
NUOMEDIS AG, Liestal, CH;
Abstract
This invention concerns scanning probe microscopes and related instruments ('SPMs') when used to investigate or measure large samples whose size is a multiple of the typical operational scanning area of an SPM, say 150 μm×150 μm at most. To avoid frequent readjustments or other time-consuming human interaction and errors when focusing the SPM, a multi-step, automated method for the SPM-scanning of large samples is disclosed, comprising a 'coarse', i.e. low resolution, non-SPM scanning or mapping step adapted to scan a large sample and providing an integral map of the sample, followed by a preferably mathematical evaluation step identifying areas of interest of the sample, which areas are then subjected to a focused “fine” raster scanning step by the SPM with high resolution. The associated apparatus provides the means to execute this novel three-step process.