The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Oct. 07, 2011
Applicants:

Seong Su Jang, Daejeon, KR;

Yeon Keun Lee, Daejeon, KR;

Kyoung Sik Moon, Daejeon, KR;

Min Soo Kang, Daejeon, KR;

Inventors:

Seong Su Jang, Daejeon, KR;

Yeon Keun Lee, Daejeon, KR;

Kyoung Sik Moon, Daejeon, KR;

Min Soo Kang, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/02 (2006.01); H01L 51/52 (2006.01); C23C 30/00 (2006.01);
U.S. Cl.
CPC ...
G02B 5/0221 (2013.01); C23C 30/00 (2013.01); H01L 51/5212 (2013.01); H01L 51/5268 (2013.01); H01L 51/5275 (2013.01); H01L 2251/5369 (2013.01); Y10T 428/24364 (2015.01); Y10T 428/24372 (2015.01); Y10T 428/24413 (2015.01); Y10T 428/24421 (2015.01);
Abstract

The present invention relates to a substrate for an organic electronic element that enables surface resistance to be reduced and light-extraction efficiency improved, the substrate including: a base substrate; a scattering layer which is formed on the base substrate and includes an conductive pattern for reducing the surface resistance of an electrode, scattering particles for scattering light and a binder, and which forms an uneven structure in the surface opposite the base substrate; and a planarizing layer which is formed on the scattering layer and flattens the surface undulations caused by the uneven structure of the scattering layer, wherein the refractive index (Na) of the scattering particles and the refractive index (Nb) of the planarizing layer satisfy the relationship in formula 1 below. [Formula 1] |Na—Nb|≧0.3. In the formula as used herein, Na signifies the refractive index of the scattering particles and Nb signifies the refractive index of the planarizing layer.


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