The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Nov. 07, 2013
Applicant:
Nihon Kessho Kogaku Co., Ltd., Tatebayashi, JP;
Inventors:
Takafumi Yamazaki, Ageo, JP;
Yusuke Shiro, Ageo, JP;
Assignee:
Nihon Kessho Kogaku Co., Ltd., Tatebayashi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 1/02 (2006.01); C30B 29/12 (2006.01); G03F 7/20 (2006.01); C01F 11/22 (2006.01); G03F 1/60 (2012.01); C30B 11/04 (2006.01);
U.S. Cl.
CPC ...
G02B 1/02 (2013.01); C01F 11/22 (2013.01); C30B 11/04 (2013.01); C30B 29/12 (2013.01); G03F 1/60 (2013.01); G03F 7/70958 (2013.01); Y10T 428/24355 (2015.01);
Abstract
A fluorite having all the more excellent laser durability compared to a conventional fluorite is provided. A fluorite is proposed, in which the standard deviation of the surface areas of the Voronoi regions in a diagram from a Voronoi decomposition of the distribution of etch-pits in the (111) plane is 6,000 μmor less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay decomposition of the distribution of etch-pits of the (111) plane is 80 μm or less.