The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Aug. 01, 2012
Applicants:

Ian Radley, Durham, GB;

Ben Cantwell, Durham, GB;

David Edward Joyce, Durham, GB;

Paul Scott, Durham, GB;

Inventors:

Ian Radley, Durham, GB;

Ben Cantwell, Durham, GB;

David Edward Joyce, Durham, GB;

Paul Scott, Durham, GB;

Assignee:

Kromek Limited, Sedgefield, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01V 5/00 (2006.01); G01N 23/087 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01); G01N 23/04 (2013.01); G01N 23/087 (2013.01); G01N 2223/423 (2013.01);
Abstract

A method processing an image dataset of radiation emergent from a test object after its irradiation by a suitable radiation source is described which comprises the steps of: generating an image dataset comprising a spatially resolved map of items of intensity data from the radiation emergent from the test object; further, resolving the intensity data items spectroscopically between at least two energy bands across the spectrum of the source; numerically processing the spectroscopically resolved intensity data items to determine a further spatially resolved dataset of data items representative of one or more orders of Compound Proton Number and/or effective mass thickness and/or a density; generating a segmented image dataset using the said dataset of data items representative of one or more orders of Compound Proton Number and/or effective mass thickness and/or a density. The method applied as part of a method for the radiological examination of an object and an apparatus for the same are also described.


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