The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Dec. 31, 2012
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Jia Hao, Beijing, CN;
Liang Li, Beijing, CN;
Nutech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
The present invention discloses apparatus and method for ray scanning imaging. The apparatus comprises a plurality of ray generators and a ray detection device. The plurality of ray generators are arranged uniformly along a circular arc and emit ray beams in sequence or simultaneously to an object to be inspected within a single scanning period. The ray detection device may be either in a multi-segmental semi-closed configuration composed of a plurality of linear arrays of ray detectors or in a circular arc configuration where a plurality of ray detectors arranged uniformly along a circular arc. During the inspection, the apparatus is advantageous in obtaining the complete ray projection values without rotation thereof, so as to effectively shorten the inspection time.