The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Jun. 13, 2013
Applicant:
Nihon Kohden Corporation, Tokyo, JP;
Inventors:
Sunao Takeda, Tokyo, JP;
Takahiro Shioyama, Tokyo, JP;
Akane Suzuki, Tokyo, JP;
Yo Kato, Tokyo, JP;
Nae Hinata, Tokyo, JP;
Assignee:
NIHON KOHDEN CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G06K 9/00 (2006.01); G06K 9/52 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G01N 33/5091 (2013.01); G06K 9/00127 (2013.01); G06K 9/00147 (2013.01); G06K 9/522 (2013.01); G06F 19/345 (2013.01);
Abstract
A cell analyzing apparatus includes: a histogram acquirer which is configured to perform measurement of a number of nuclear stained cells, and which, by using a result of the measurement, is configured to acquire a histogram indicating a fluorescence intensity; and an analysis controller which is configured to apply frequency analysis on data of the histogram acquired by the histogram acquirer, and which is configured to determine existence/nonexistence of cancer cells based on a result of the frequency analysis.