The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Mar. 14, 2013
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Takako Mizoguchi, Sayama, JP;

Ryuzo Kawabata, Higashiyamato, JP;

Akihiko Kandori, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
G01N 27/72 (2013.01); G01N 33/54333 (2013.01);
Abstract

In a magnetic immunoassay using AC magnetic susceptibility measurement, a signal from non-coupled magnetic particles is prevented to mix with a desired measurement signal from magnetic particles coupled with an object to be measured. A sample vessel in which a mixed solution of an inspection objective sample and the magnetic particles are included is carried by a sample support, such that a precipitation of the magnetic particle coupled with the object to be measured dispersed in the solution by a magnetic field from a dissociating coil is promoted. Next, the sample vessel is carried to the magnetizing coil and the magnetic signal from the non-coupled magnetic particle remaining in a supernatant in the vessel is peculiarly measured by an MR sensor to perform AC magnetic susceptibility measurement with high precision.


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