The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Dec. 21, 2012
Techno-x Co., Ltd., Osaka-shi, JP;
Tadashi Utaka, Takatsuki, JP;
Koichi Muraoka, Setagaya-ku, JP;
Techno-X Co., Ltd., Osaka-shi, JP;
Abstract
An X-ray fluorescence spectrometer irradiates a measurement samplewith primary X rays from an X-ray source, and excites an element in the sampleto emit fluorescence X rays, and the primary X-rays are partially scattered as scattered X rays from the sample. A spectroscopic system is placed so that a first spectroscopic unit, a second spectroscopic unit, and a single X-ray detector form an optimized optical system. The first spectroscopic unit disperses the fluorescence X rays to collect the resultant X rays onto the X-ray detector. The second spectroscopic unit disperses the scattered X rays to collect the resultant X rays onto the X-ray detector. In this manner, the spectroscopic system disperses the fluorescence X rays and the scattered X rays so that the intensity of the fluorescence X rays and the intensity of the scattered X rays can be detected by the single X-ray detector