The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Apr. 27, 2012
Applicants:

Andrew Michael Maiden, Sheffield, GB;

Martin James Humphry, Sheffield, GB;

Inventors:

Andrew Michael Maiden, Sheffield, GB;

Martin James Humphry, Sheffield, GB;

Assignee:

PHASE FOCUS LIMITED, Sheffield, South Yorkshire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/05 (2013.01); G06T 1/0007 (2013.01); G06T 2207/20208 (2013.01);
Abstract

Embodiments of the present invention provide a method () of providing image data for constructing an image of a region of a target object, comprising detecting, by at least one detector (), at least a portion of radiation scattered by a target object () with the incident radiation () or an aperture at a predetermined probe position, determining an offset vector () for reducing an error associated with the probe position (), estimating a wavefront () based on a probe function having the offset vector applied to the probe position, and providing image data responsive to the detected radiation.


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