The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Apr. 23, 2014
Applicant:

Cornell University, Ithaca, NY (US);

Inventors:

Harold G. Craighead, Ithaca, NY (US);

Benjamin R. Cipriany, Ithaca, NY (US);

Stephen Levy, Ithaca, NY (US);

Paul Soloway, Ithaca, NY (US);

Assignee:

Cornell University, Ithaca, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/68 (2013.01); B01L 3/502761 (2013.01); C12Q 1/6827 (2013.01); B01L 2200/0663 (2013.01); B01L 2300/0654 (2013.01); C12Q 2537/164 (2013.01); C12Q 2565/629 (2013.01); C12Q 2565/631 (2013.01);
Abstract

Provided herein are methods and devices for single object detection. The methods and devices can be used to identify a plurality epigenetic markers on a genetic material, or a chromatin, encompassing fragments thereof. The invention provides for the characterization of the genetic material flowing through a channel in a continuous body of fluid based on detection of one or more properties of the genetic material. The methods and systems provided herein allow genome-wide, high-throughput epigenetic analysis and overcome a variety of limitations common to bulk analysis techniques.


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