The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Apr. 17, 2014
Tsu-wang Shen, Hualien, TW;
Tsung-yu Ho, Taipei, TW;
Weng-kong Tam, Hualien, TW;
Yu-nong Wang, New Taipei, TW;
Tsu-Wang Shen, Hualien, TW;
Tsung-Yu Ho, Taipei, TW;
Weng-Kong Tam, Hualien, TW;
Yu-Nong Wang, New Taipei, TW;
Other;
Abstract
An optical system for measuring an observed object includes an illuminant component, an imaging component, and an optical component. The illuminant component generates a measuring light. The optical component including a mirror and a beam splitter is located between the illuminant component and the imaging component. The mirror is located between the illuminant component and the observed object, the beam splitter is located between the mirror, the observed object, and the imaging component. The measuring light is projected to the observed object via the mirror and beam splitter, and an imaging light that has been generated from the illuminant component and reflected by the observed object is projected to the imaging component via the beam splitter, the imaging light and the measuring light intersect at the beam splitter. The present invention also provides a measurement method.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile