The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Aug. 23, 2013
Applicants:
Michael D. Kaiser, Natick, MA (US);
David R. Smith, San Jose, CA (US);
Inventors:
Michael D. Kaiser, Natick, MA (US);
David R. Smith, San Jose, CA (US);
Assignee:
Affymetrix, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); H04N 5/372 (2011.01); G06T 5/00 (2006.01); G06T 3/40 (2006.01); G06T 5/50 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
H04N 5/372 (2013.01); G06T 3/4069 (2013.01); G06T 5/003 (2013.01); G06T 5/50 (2013.01); G01N 21/6452 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/30072 (2013.01);
Abstract
An embodiment of a method for resolving features on a probe array is described that, comprises acquiring a plurality of micro-shifted images of a region of a probe array; reconstructing an image of the probe array using the micro-shifted images; and deriving intensity values for one or more probe features disposed on the probe array from the reconstructed image.
Kaiser, Michael. (2016). System, method, and product for imaging probe arrays with small feature sizes (U.S. Patent No. 9445025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9445025
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile