The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Mar. 13, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Masaki Yamazaki, Tokyo, JP;

Akihito Seki, Kanagawa, JP;

Kenichi Shimoyama, Tokyo, JP;

Satoshi Ito, Kanagawa, JP;

Yuta Itoh, Kanagawa, JP;

Ryuzo Okada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2351 (2013.01); H04N 5/232 (2013.01);
Abstract

An area identifying device includes a projecting unit, an image capturing unit, a calculating unit, and an identifying unit. The projecting unit is configured to project a pattern so that the pattern performs a predetermined movement. The image capturing unit is configured to capture, in sequential order, multiple images of a projection area on which the pattern is projected, each image including a plurality of image areas. The calculating unit is configured to calculate an amount of change of pattern appearances for each image area in the multiple images. The identifying unit is configured to identify, as a reflective area, at least one image area having a different amount of change of the pattern appearances from a reference amount of change of the pattern appearances based on the predetermined movement, among the calculated amounts of change of the pattern appearances.


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