The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Aug. 05, 2014
Applicant:
Omnivision Technologies, Inc., Santa Clara, CA (US);
Inventor:
Ming-Kai Hsu, Fremont, CA (US);
Assignee:
OmniVision Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); G06K 9/46 (2006.01); H04N 5/232 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23219 (2013.01); G06K 9/00241 (2013.01); G06K 9/00248 (2013.01); G06K 9/00281 (2013.01); G06K 9/00308 (2013.01); G06K 9/6206 (2013.01); G06K 9/6276 (2013.01); H04N 5/23222 (2013.01);
Abstract
A feature detection process includes identifying an approximate location of a feature in a preliminary image. A gradient phase map of image pixel intensities within the approximate location is computed. A projection result is determined by applying a projection function to the gradient phase map. The projection result is analyzed to determine a state of the feature.