The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Nov. 13, 2014
Applicant:

Lytro, Inc., Mountain View, CA (US);

Inventors:

Chia-Kai Liang, San Jose, CA (US);

Colvin Pitts, Snohomish, WA (US);

Assignee:

Lytro, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); H04N 5/23293 (2013.01); G06T 2207/10052 (2013.01);
Abstract

According to various embodiments, the system and method disclosed herein process light-field image data so as to prevent, mitigate, and/or remove artifacts and/or other image degradation effects. A light-field image may be captured with a light-field image capture device with a microlens array. Based on a depth map of the light-field image, a plurality of layers may be created, and samples from the light-field image may be projected onto the layers to create a plurality of layer images. The layer images may be processed with one or more algorithms such as an inpainting algorithm to fill null values, a reconstruction algorithm to correct degradation effects from capture, and/or an enhancement algorithm to adjust the color, brightness, contrast, and/or sharpness of the layer image. Then, the layer images may be combined to generate a processed light-field image.


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